Large-Sample, Non-Contact Measurement & Analysis

You Make It, We Measure It — Nano to Macro Features

       The NPFLEX™ provides the most flexible, non-contact, 3D areal surface characterization for such large samples as orthopedic medical implants and the larger parts in aerospace, automotive and precision machining industries. The NPFLEX also provides data density, resolution, and repeatability beyond what is possible with contact instrumentation, making it ideal as both a complementary technology or as a stand-alone metrology solution.

Unparalled Flexibility in a Precision Metrology Solution

       NPFLEX is designed specifically for investigating widely varying sample sizes and shapes without damaging the sample. Insensitive to material type, the system’s WLI technology provides 3D, non-contact measurements of virtually any surface feature. 
       A breakthrough open-gantry design affords more than 300 degrees of access to surfaces previously inaccessible or too difficult to analyze due to size or part orientation. With 13 inches (330 millimeters) of space below the objectives, there is easy accessibility to part areas that simply can’t be reached with other types of profilometers. The clearance beneath the objectives provides ample room for all types of custom fixtures and mounts.

       NPFLEX’s low-profile, 300-millimeter indexed, automated XY stage offers the largest working area of any automated interferometer on the market. If more room is needed, the stage can be removed with ease. This open architecture works hand-in-hand with the patented tip/tilt optical head, which maintains the ideal line of sight to the surface under inspection with extremely long working distances. 
       NPFLEX includes a high-resolution CCD camera option for color imaging. LED illumination is optimized for clearer imaging and better data display. The system has an automated focus finder, white balancing that enables RGB color optimization, and 3D color overlays. NPFLEX provides the advantages of vivid color imaging with color data segmentation plus analysis—all with the best Z-height resolution, speed, and automation capabilities available.

Many Options and Configurations for a Truly Customized Solution

       The NPFLEX system offers many options to customize its operation for specific applications. The Swivel Head option permits repetitive investigation of sidewalls, beveled edges, and angled surfaces. Additionally, there are several stage options available:

·  Rotational stage with optional chuck for holding fixtures

·  Theta rotating stage for sample rotation

·  Phi rotating stage for vertical sample rotation

·  Phi Roller Stage for automated positioning and rotation of smaller, cylindrical samples

·  Automated XY Stage for automated XY positioning

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Contact our application team immediately: 021-37018108, info@boyuesh.com